Journal of Electronic Testing
ISSN 0923-8174 · Springer Science+Business Media · Netherlands · active 1981–2026
Metrics
“Cites per paper” is a two-year cited-by rate computed from OpenAlex. It is not a Clarivate Journal Impact Factor — we neither compute nor license that metric. Citation rates differ enormously between fields, so compare within a discipline.
Indexing & access
Access status: unknown. Where this comes from publisher-level signals rather than works-level data it is a heuristic — confirm on the journal’s own site, especially regarding any article processing charge.
Scope
Frequently asked
Is Journal of Electronic Testing a predatory journal?
Our screening does not flag Journal of Electronic Testing. That is not a guarantee of quality — it means the venue is not on Beall's archive (frozen since 2017) and does not match our name-pattern heuristic. It is listed in Scopus, Web of Science, which is a positive signal.
Is Journal of Electronic Testing indexed in Scopus or Web of Science?
Per our venue index, Journal of Electronic Testing appears in: Scopus, Web of Science. Index membership changes over time — confirm on the index's own site before relying on it.
What is Journal of Electronic Testing's impact?
Papers in Journal of Electronic Testing are cited about 1.5 times each within two years of publication, and Scimago places it in Q3, with an h-index of 51. This is not a Clarivate Journal Impact Factor — we neither compute nor license that metric — and a citation rate is a property of a field as much as of a journal.
Is Journal of Electronic Testing open access?
We hold no reliable open-access classification for Journal of Electronic Testing. Check the journal's own site for its access model and any article processing charge.
Similar venues
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- IntegrationQ2 · Elsevier BV
- IEEE Transactions on Very Large Scale Integration (VLSI) SystemsQ1 · Institute of Electrical and Electronics Engineers
- Microprocessors and MicrosystemsQ2 · Elsevier BV