IEEE Transactions on Device and Materials Reliability
ISSN 1530-4388 · Institute of Electrical and Electronics Engineers · United States · active 2001–2026
Metrics
- Best Scimago quartile (2025)
- Q2
- Cites per paper (2y)
- 2.2
- SJR
- 0.451
- h-index
- 89
“Cites per paper” is a two-year cited-by rate computed from OpenAlex. It is not a Clarivate Journal Impact Factor — we neither compute nor license that metric (how the two differ). Citation rates differ enormously between fields, so compare within a discipline. What the other figures mean: journal quartile, SJR, h-index and article processing charge.
Data as of 1 November 2026 (venue index build).
Scimago Journal Rank 2025
In the Scimago Journal Rank 2025 edition, IEEE Transactions on Device and Materials Reliability is Q2 in 2 of its 3 subject categories and Q3 in the other 1. Its best category quartile is Q2.
| Subject category | Quartile | Rank in category |
|---|---|---|
| Safety, Risk, Reliability and Quality | Q2 | #95 of 221 |
| Electrical and Electronic Engineering | Q2 | #368 of 811 |
| Electronic, Optical and Magnetic Materials | Q3 | #144 of 279 |
- Cites per document (2 years, Scopus)
- 2.80
- Documents indexed in 2025 (Scopus)
- 140
The quartile is the one Scimago prints for each category. Rank is the journal's position by SJR among the journals Scimago lists in that category (#1 is the highest); “—” means we hold no rank consistent with that quartile. The document count is what Scopus indexed that year, which can be lower than a journal's full output. Source: SCImago Journal Rank 2025 edition, from Scopus data (scimagojr.com, CC BY-NC).
IEEE Transactions on Device and Materials Reliability is Q2 in 2 of its 3 Scimago subject categories (2025 edition; best category Safety, Risk, Reliability and Quality: Q2, #95 of 221), with SJR 0.451 (Scimago) and an h-index of 89 (OpenAlex). Listed in Scopus, Web of Science, PubMed.
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Indexing & access
- Indexed in
- ScopusWeb of SciencePubMed
- Access status:
- subscription. Where this comes from publisher-level signals rather than works-level data it is a heuristic — confirm on the journal’s own site, especially regarding any article processing charge.
Scope
Frequently asked
Is IEEE Transactions on Device and Materials Reliability a predatory journal?
Our screening does not flag IEEE Transactions on Device and Materials Reliability. That is not a guarantee of quality — it means the venue is not on Beall's archive (frozen since 2017) and does not match our name-pattern heuristic. It is listed in Scopus, Web of Science, PubMed, which is a positive signal.
Is IEEE Transactions on Device and Materials Reliability indexed in Scopus or Web of Science?
Per our venue index, IEEE Transactions on Device and Materials Reliability appears in: Scopus, Web of Science, PubMed. Index membership changes over time — confirm on the index's own site before relying on it.
What is the impact factor of IEEE Transactions on Device and Materials Reliability?
Papers in IEEE Transactions on Device and Materials Reliability are cited about 2.2 times each within two years of publication, and Scimago places it in Q2, with an h-index of 89. Those are the open equivalents: the Clarivate Journal Impact Factor is a proprietary metric we neither compute nor license, so we show the two-year citation rate and Scimago quartile instead — they answer the same question of how heavily the journal is cited. A citation rate is a property of a field as much as of a journal.
What Scimago quartile is IEEE Transactions on Device and Materials Reliability (Q1, Q2, Q3, or Q4)?
In the Scimago Journal Rank 2025 edition, IEEE Transactions on Device and Materials Reliability is Q2 in 2 of its 3 subject categories and Q3 in the other 1. By category: Safety, Risk, Reliability and Quality: Q2, #95 of 221; Electrical and Electronic Engineering: Q2, #368 of 811; Electronic, Optical and Magnetic Materials: Q3, #144 of 279. Its best category quartile is Q2. Quartiles split the journals in a subject category into four equal groups by SJR, so Q1 is the most-cited quarter and Q4 the least; IEEE Transactions on Device and Materials Reliability is cited about 2.2 times per paper over two years, with an h-index of 89.
What is the Web of Science (JCR) quartile of IEEE Transactions on Device and Materials Reliability?
The Web of Science quartile comes from Clarivate's Journal Citation Reports (JCR), a proprietary product we neither license nor compute — so we cannot state a JCR quartile for IEEE Transactions on Device and Materials Reliability. The open equivalent is its best Scimago quartile, Q2 in Safety, Risk, Reliability and Quality and 1 other category, derived from Scopus citation data. Because JCR ranks against Web of Science and Scimago against Scopus, the two can differ, so check Clarivate's site directly if you need the JCR quartile specifically.
Is IEEE Transactions on Device and Materials Reliability open access?
Our index records its access status as "subscription". Where this is derived from publisher-level signals rather than works-level data it is a heuristic, so confirm on the journal's own site — particularly if an article processing charge matters to you.
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Compare it with its peers: Ranked Electrical and Electronic Engineering journals — ranked by Scimago quartile and cites per paper, predatory venues excluded.